APA Style
K. Nguyen,K. Wang;Y. Bu,L. Bang;G. Xu, A. De Lucia,V. Deufemia;C. Gravino,M. Risi, Y. Xiang,Y. Zhou;Z. Zheng,M. Li. (2017).
Bundel Jurnal Software Engineering and Methodology: Understanding and Combating Memory Bloat in Managed Data-Intensive Systems/ Detecting the Behavior of Design Patterns through Model Checking and Dynamic Analysis/ Configuring Software Product Lines by Combining Many-Objective Optimization and SAT Solvers (4).
New York:
Association for Computing Machinery.
Chicago Style
K. Nguyen,K. Wang;Y. Bu,L. Bang;G. Xu, A. De Lucia,V. Deufemia;C. Gravino,M. Risi, Y. Xiang,Y. Zhou;Z. Zheng,M. Li.
Bundel Jurnal Software Engineering and Methodology: Understanding and Combating Memory Bloat in Managed Data-Intensive Systems/ Detecting the Behavior of Design Patterns through Model Checking and Dynamic Analysis/ Configuring Software Product Lines by Combining Many-Objective Optimization and SAT Solvers.
4
New York:
Association for Computing Machinery,
2017.
Bundel Jurnal.
MLA Style
K. Nguyen,K. Wang;Y. Bu,L. Bang;G. Xu, A. De Lucia,V. Deufemia;C. Gravino,M. Risi, Y. Xiang,Y. Zhou;Z. Zheng,M. Li.
Bundel Jurnal Software Engineering and Methodology: Understanding and Combating Memory Bloat in Managed Data-Intensive Systems/ Detecting the Behavior of Design Patterns through Model Checking and Dynamic Analysis/ Configuring Software Product Lines by Combining Many-Objective Optimization and SAT Solvers.
4
New York:
Association for Computing Machinery,
2017.
Bundel Jurnal.
Turabian Style
K. Nguyen,K. Wang;Y. Bu,L. Bang;G. Xu, A. De Lucia,V. Deufemia;C. Gravino,M. Risi, Y. Xiang,Y. Zhou;Z. Zheng,M. Li.
Bundel Jurnal Software Engineering and Methodology: Understanding and Combating Memory Bloat in Managed Data-Intensive Systems/ Detecting the Behavior of Design Patterns through Model Checking and Dynamic Analysis/ Configuring Software Product Lines by Combining Many-Objective Optimization and SAT Solvers.
4
New York:
Association for Computing Machinery,
2017.
Bundel Jurnal.